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Nexperia's NextPower 80/100V MOSFETs boost design flexibility

7th August 2024
Sheryl Miles
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Nexperia has announced that the ongoing expansion of its NextPower 80V and 100V MOSFET portfolio is continuing apace with the release of several new LFPAK devices in industry-standard 5 x 6mm and 8 x 8mm footprints.

These new NextPower 80/100 V MOSFETs are optimised for low RDS(on) and low Qrr, to deliver high efficiency and low spiking in applications including servers, power supplies, fast chargers, and USB-PD as well as for a wide range of telecommunications, motor control, and other industrial equipment. Designers can choose from a range of 80V and 100V devices, with RDS(on) from 1.8mΩ to 15mΩ.

Many MOSFET manufacturers focus on achieving high efficiency through low QG(tot) and low QGD, when benchmarking the switching performance of their devices against alternative offerings. However, through extensive research, Nexperia has identified Qrr as being even just as important due to its impact on spiking and, in turn, the amount of electromagnetic interference (EMI) generated during device switching. By focusing on this parameter, Nexperia has considerably reduced the level of spiking produced by its NextPower 80/100V MOSFETs and hence also lowered the amount of EMI they produce. This brings significant benefits for end users by reducing the probability of a costly late-stage redesign to include additional external components if their application fails electromagnetic compatibility (EMC) testing.

The on-resistance (RDSon) of these new MOSFETs has been reduced by up to 31% compared to currently available devices. Nexperia also plans to further strengthen its NextPower 80/100V portfolio later this year with the release of an additional LFPAK88 MOSFET offering RDS(on) down to 1.2mΩ @ 80V, as well as introducing the power dense CCPAK1212 to the portfolio.

To further support design-in and qualification of these devices, Nexperia offers the availability of award-winning interactive datasheets, providing engineers with comprehensive and user-friendly insights into device behaviour.

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