Slit beam profiler takes sub micron measurements

2nd November 2015

Mick Elliott

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Datasheet

A high power, scanning slit beam profiler, NanoScan 2s is now available in a more compact size from Ophir. The NIST-calibrated profiler instantly measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers. It offers silicon, germanium, or pyroelectric detectors; this allows profiling lasers of any wavelength, from UV to far infrared, to 100μm and beyond.

New NanoScan 2s software, available in Standard and Professional versions, allows users to custom configure the display interface; results can be shown on a single, easy-to-read screen or across multiple screens.

The profileruses moving slits – one of the ISO standard scanning aperture techniques – to measure beam sizes from µm to cm at beam powers from µW to kW. The natural attenuation provided by the slit allows the measurement of many beams with little or no additional attenuation required.

The digital controller provides deep, 16-bit digitisation of the signal for high dynamic range up to 35dB power; this makes it possible to measure beam size and beam pointing with 3-sigma precision to several hundred nanometers.

The silicon or germanium detector-based NanoScan2s's include an integrated 200mW power meter that displays both total power and individual power in each of the beams being measured.

NanoScan 2s software can measure from one to 16 beams in the aperture with sub-micron precision. A beam can be found in less than 0.3 seconds and real-time updates can be displayed to 20Hz.

The Microsoft Windows-compatible software is available in two versions: Standard and Professional. The Professional version includes ActiveX automation for integrating the profiler into OEM systems or creating custom user interface screens using C++, LabVIEW, Excel, or other software packages.