Ophir Photonics Group Introduces Fast, Automated, CO2 Laser Beam Propagation Analyzer for M2 Measurements

NanoModeScan is also fast; an M2 measurement can be made in as little as 20 seconds. In addition, the system reports beam waist diameter and location, divergence, and the beam’s Rayleigh range for each axis. The NanoModeScan’s ease of use and fast update rate (up to 20Hz) makes it ideal for CO2 laser-based material processing, machining, and marking applications where laser performance needs to be adjusted in real-time.

“It is important to understand variations in the production process,” stated Allen Cary, Sales and Marketing Manager, Ophir-Photon LLC. “The faster laser beam parameters can be quantified and documented, the quicker adjustments can be made to maintain product quality and reduce downtime. NanoModeScan is a valuable tool in this process because its rapid update rates allow for real-time adjustments and it’s comprehensive set of measurements meet quality control requirements.”

The NanoModeScan M2 combines the flexibility and speed of Photon Inc.’s NanoScan near-field profiler with dedicated M2 measurement hardware and software. The system provides automated measurement of M2 in as little as 20 seconds using either the ISO 11146 or Rayleigh method. It reports such parameters as M2 times diffraction limit, K beam propagation factor, d0 beam waist size, Z0 beam waist location, ø divergence, and Zr Rayleigh range.

The NanoModeScan’s software controlled variable scan speed allows the measurement of both CW and kHz pulsed lasers, covering the entire wavelength range from UV to FIR. Rapid beam finding and auto ranging speed up the total M2 measurement to ~20 seconds for CW lasers.

Both 200mm and 400mm lenses are available to generate the proper artificial waist for the laser source under test. For ease of alignment, the system includes an entrance iris on the op- tical axis and a precision alignment stage for horizontal and vertical positioning.