Inspection system developed for versatile 3D X-ray analysis

The X7056 inspection system was developed for versatile 3D X-ray analysis, where the highest precision and inspection depth is at a premium. This innovative inspection concept enables any view of the inspection object to be realised, guaranteeing versatile adaptation of the 3D image quality to the widest range of inspection requirements.

The flat panel detector ensures outstanding image quality with remarkable depth of information and high contrast. Together with the sealed microfocus X-ray tubes, an exceptional first-pass-yield is achieved.

Even the inspection of electronic assemblies populated on both sides is accomplished without a hitch. By separating the two sides of the assembly in the 3D reconstruction, reliable inspection of all production defects is guaranteed.

The system can also be equipped with an optional AOI unit. Here, the Viscom 8M, XM or XM 3D camera modules can be employed. This allows for two inspection technologies which supplement each other to be integrated within one system.