Optoelectronics

Spiricon's BeamGage Laser Profiling System Adds Sophisticated Image Processing, 64-bit Windows Compatibility, & Support for English, Japanese, Chinese, German

24th January 2012
ES Admin
0
Spiricon today announced BeamGage version 5.7, the company's next generation laser beam analysis software, at Photonics West. The system adds new advanced image processing features, including fast, off-axis correction of distorted beam images. It supports Ophir's popular laser power meters - Pulsar, Nova II, Vega, and Juno, as well as 64-bit versions of Windows Vista and Windows 7. In addition, BeamGage is now a multilingual platform, adding native language support for English, Japanese, and Chinese, plus compatibility with the German Microsoft Windows environments.
Unlike traditional beam diagnostic tools, BeamGage is a comprehensive laser beam profiling software system that analyzes a beam's size, shape, uniformity, and divergence to ensure you're getting the laser beam you thought you were, stated Gary Wagner, President, Ophir-Spiricon. The latest version includes advanced image processing that adapts to less than ideal environments, such as camera offset angles. And it is the only camera-based profiling application to incorporate NIST traceable power measurements. The addition of multi-language support and new units of measurement makes this a global product that easily integrates into the work environments of a wide variety of system operators.

Flexibility & Advanced Processing

BeamGage provides a way to quickly detect and correct the skew of an image when the camera angle is offset form the line of sight of the laser beam it is measuring. Based on a sophisticated image compression algorithm, BeamGage can correct off-axis beam images that are angled up to 45 degrees from the perpendicular line of the laser. This provides additional flexibility, which is especially needed for applications that are set up in restrictive spaces.
A new fixed mm spatial unit option allows users to choose between scientific notation and fixed decimal point millimeter units.

Power Meter Interface

BeamGage 5.7 interfaces with most Ophir power meters, including the Nova II handheld, the Vega color display, the Pulsar PC interface (all versions, 1, 2, 3, and 4), and the Juno USB interface. BeamGage provides a range of ways to integrate with power/energy readings. Supported functions include total power or energy, peak power/energy density, average pulse power, peak pulse power, device efficiency, and % in aperture.

Multiple Languages, 64-Bit Support

BeamGage supports both the 64-bit and 32-bit versions of Windows Vista and Windows 7, enhancing system configuration options and increasing processing speed. The software also provides native language support for English, Japanese, and Chinese. The software is also compatible with the German Windows Vista and Windows 7 environments.

BeamGage is the industry's first beam profiling software to be newly designed, from scratch, using the most advanced tools and technologies.
Based on UltraCal™, Ophir-Spiricon's patented baseline correction algorithm, BeamGage provides high accuracy results, guaranteeing the data baseline (zero-point reference) is accurate to 1/8th of a digital count on a pixel-by-pixel basis. BeamGage is available in three versions: Standard, Professional, and Enterprise. BeamGage Standard features BeamMaker® beam simulator, automatic camera control for ease of use, and a comprehensive set of beam analysis algorithms. BeamGage Professional adds such capabilities as partitioning of the camera output for separate analysis of multiple laser beams from sources such as fiber, a .NET interface for full remote control when integrating beam analysis into an automated application, and camera sharing. BeamGage Enterprise includes support for high-speed, networked cameras, including GigE, Gigabit Ethernet.

Availability & Pricing

BeamGage® 5.7, Standard, Professional, and Enterprise Editions, are available now. OEM pricing is available on request.

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier