Fujitsu Introduces Evaluation Kit for CHAIS ADC Technology

The BATBOARD achieves a unique level of performance for the sampling of high-speed signals for evaluation purposes and is ideal for prototyping next generation test and measurement systems. Two delay matched channels with >15GHz bandwidth are each sampled at 56GSa/s by the ROBIN chip. The captured 8-bit ADC signals are stored on-chip in memory, allowing data access at low speed via USB. Several trigger options are available enabling the capture of transient events such as data edges and glitches. Low loss material, suitable for lead-free assembly in high-reliability applications, has been used in the multi-layer PCB design, providing superior signal integrity.

“With the BATBOARD our customers can gain early access to our leading-edge ADC technology with an easy-to-use demonstrator that helps them solve the difficult problems of high-speed signal acquisition,” said Neil Amos, Director of the Communications Business Unit at FME. “The evaluation kit allows customers to prototype new high-end test systems, optical front-ends with breakthrough performance levels and enables them to do forward looking research.”

The BATBOARD evaluation kit contains everything needed to get started including evaluation board, single-ended to dual-channel differential signal splitter, PC-USB interface and software. It is offered in two versions with the ROBIN chip either soldered to the PCB or mounted in a high bandwidth socket.