RX100 MCUs provide exceptional EMC performance

By performing burst tests on each pin of the RX110 MCU, Langer EMV’s IC test engineer has ascertained that the port pins’ immunity is high as it overcomes ±300V during the Pulse Voltage Test.

Vincent Mignard, Renesas’ Marketing Engineer for Smart Home, comments: “The electronic content of home appliances is continuing to grow and the environment in which they operate can be subject to a lot of electrical noise. Accordingly, white goods manufacturers are looking increasingly for MCUs that have robust protection against electro-magnetic interference. The Langer EMV burst tests confirm that the new RX110 microcontrollers are perfectly suited to such applications and are a strong solution to a noisy environment. To decrease on-chip power/ground noise interference, Renesas implemented separated internal power/ground lines. Sensitive MCU pins are equipped with analogue RC filters and the key digital input functions include programmable digital filters.”

Inductive components, such as motors, induction rings or relays, through which a current is interrupted are one of the most common sources of electrical noise in domestic white goods. Langer EMV's measurement system enables comprehensive testing of the microcontroller’s response to Electric Fast Transient tests on each pin. The injected pulse disturbances and voltage spikes reach up +/-510V on the signal pins without disturbing the MCU.

Langer EMV has tested the RX110 MCU, a member of the RX100 family, in a 64-pin package. The test results show a high level of robustness for a microcontroller against spikes and fast transient.