Design
Flexible multi-channel AFE for 5G wireless test systems
This high speed multi-channel data capture reference design from Texas Instruments enables optimum system performance. System designers needs to consider critical design parameters like clock jitter and skew for high speed multi-channel clock generation, which affects overall system SNR, SFDR, channel to channel skew and deterministic latency.
This reference design demonstrates multi-channel AFE and clock solution using high speed data converters with JESD204B, high speed amplifiers, high performance clocks and low noise power solutions to achieve optimum system performance.
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