Evaluation tools enable fast, easy RF testing

26th May 2015

Barney Scott

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NXP has unveiled a set of plug-and play evaluation tools designed to enable fast and easy testing of RF energy applications. The evaluation tools will be demonstrated at the IEEE MTT International Microwave Symposium (IMS) 2015, booth #1141, at the Phoenix Convention Center. Applications include solid-state cooking, RF sparkplugs, RF plasma lighting, RF heating/drying and medical therapy.

The tools will debut alongside NXP’s RF energy power amplifier in copper flange package (air cavity plastic 3^rd gen, ACP-3) with breakthrough thermal performance and NXP’s 9^th gen Laterally Diffused Metal Oxide Semiconductor (LDMOS) which can be suited for S-band radar applications.

Designed from the ground up to enable engineers with simple plug-and-play testing for RF energy applications, the NXP evaluation tools feature control and measurement functions efficiently viewable from one screen. It also saves development time by eliminating the need for low-level programming and enabling all possible algorithms be set and tested at once. To further shorten time to market, the evaluation kit allows developers to use LabVIEW codes as example codes for final programming. This added functionality allows design teams to test without interrupting lab design workflows.

Delivering breakthrough thermal performance management with 30% improvement compared to existing products, NXP’s BLC2425M9XS250 power amplifier enables product designers to improve, simplify and reduce cost for RF designs by saving board space.

NXP announced that its 9^th gen LDMOS RF power transistors, BLS9G2934LS400, can achieve required power and efficiency levels in S-band radar applications. S-band radar applications is a fast growing sub-segment in RF power applications. S-band radar applications include weather radar, surface ship radar and some communications satellites.