Design
GOEPEL combines Boundary Scan with NI's FlexRIO
GOEPEL electronic has announced development of a Boundary Scan option for National Instruments‘ PXI/PXIe FlexRIO cards. The solution enables the utilization of the FPGA based FlexRIO hardware as Boundary scan I/O module. That provides users a wide range of supplementing test strategies for a significant increase in structural test depth for prototypes or in the production process.
“O“Technologies such as Boundary Scan and FlexRIO are fundamentally important the testing of our products“, says Antonio Cardinale, Senior Test Manager with SELEX Galileo. “The successful cooperation with GOEPEL electronic provides us a highly efficient utilization of the PXI Express FlexRIO modules. We are now in an excellent position to interlock structural and functional test strategies even deeper on one test platform”.
“National Instruments’ PXI and PXI Express based FlexRIO modules offer an unrivalled flexibility for numerous instruments and applications“, adds Rahman Jamal, Technical & Marketing Director Europe with National Instruments. “In this sense, the newly developed Boundary Scan adaption is an important step towards this potential’s practical implementation“.