Microscan to Debut Track, Trace and Control Solution at NEPCON China 2010

Microscan’s TTC middleware is specifically designed to provide work-in-progress (WIP) visibility through any factory (tracking), validate the process flow (control) and provide the history of the process steps accomplished on a product (traceability). With TTC middleware, efficient data collection is combined with error proofing to demonstrate process compliance, while reducing material and assembly costs.



Developed by experts in the electronics industry for the electronics industry, this new solution ensures that the right material is at the right place at the right time, along with the historical data to prove it. The middleware provides complete, real time data visibility across the plant floor for any and all data collection points. This can include data collected from machine vision inspections, RFID, barcode and 2D readers.



The Microscan TTC solution allows simple implementation, featuring Web-based controls and reporting, separate from the main IT plant floor network. The solution includes middleware, choice of hardware and complete visibility online for real time reporting. Connectivity to all commonly used MES and ERP systems is easily accomplished. Additionally, it features visual warnings and alarms if a product is scanned at the entry of the wrong operation or if the operation is out of sequence.



During a downturn, successful companies are those that focus on bottom line improvements, such as traceability and process workflow improvements. Microscan’s TTC solution allows users to acquire more profit out of current sales and production by reducing scrap, preventing quality errors, and increasing throughput speed.



Microscan provides track, trace and control systems to a number of industries worldwide including electronics manufacturing, medical equipment, auto parts manufacturing, logistics systems and factory automation. Microscan is seeking distribution partners in China and welcomes enquiries from potential partners.