Cables/Connecting
National Instruments Expands High-Density Switching Capabilities for PXI
National Instruments has introduced eight new relay cards that expand its NI SwitchBlock line of high-density switching solutions for PXI systems. The new cards offer additional simultaneous connections and new differential measurement capabilities for high-channel-count switching applications. Engineers can choose from the expanded selection of NI SwitchBlock cards to create a custom matrix of relays that meets their specific requirements. Designed specifically for demanding automated test systems with large numbers of channels, the NI SwitchBlock cards provide an intuitive option for switch configuration, routing, programming and maintenance in a variety of test applications in military and aerospace, transportation and for general-purpose automated testing.
The The new cards also integrate with NI Switch Executive switch management software to give engineers the ability to graphically configure their switch systems one relay at a time for total control, or automatically route signals across multiple relay cards simply by specifying endpoints. This high level of abstraction helps engineers to quickly and efficiently begin developing their application. By combining NI Switch Executive with NI LabVIEW system design software, engineers can abstract numerous route groups to easily configure, program and maintain large matrix configurations. All NI SwitchBlock solutions also include the new NI Switch Health Center software, which increases long-term system reliability by automatically running onboard diagnostics that verify relay continuity and display relay count information.
Additionally, engineers can combine the NI SwitchBlock with mass interconnect solutions from MAC Panel and Virginia Panel, which provide a single rugged connection point between multiple NI SwitchBlock connectors and a test fixture. This further simplifies wiring for large matrix configurations and helps engineers streamline hardware integration and reduce test setup time.