QFN 0.5 mm Pitch Test & Burn-In Sockets

23rd June 2007

ES Admin

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Yamaichi Electronics has introduced the QFN 0.5 mm pitch Open Top socket series NP473, NP404 and NP474 for test & burn-in applications. The new open top QFN socket series have a high-reliable fine pitch 0.5 mm contact system and a standard socket scaling. For automated loading the loader change-kit needs not to be replaced for different package sizes which helps to save changeover times and costs. The standard socket size was realized as a simple but high-reliable solution for all required test & burn-in applications. The new QFN series can be implemented without great effort for different Burn-In board IC loader settings.

Through different guide-post designs several types of ICs can be tested by only one base socket size.
The outer dimensions of the socket are:
• NP473 series: 25.0 x 25.0 x 20.5 mm / applicable to odd pin counts on each side (IC’s having 12 - 44 pins)
• NP404 series: 32.0 x 32.0 x 20.5mm / applicable to even pin counts on each side (IC’s having 16 - 88 pins)
• NP474 series: 45.0 x 45.0 x 20.5mm / applicable to odd pin counts on each side or dual rows (IC’s having 52 - 124 pins)

The highly reliable contact mechanism is realised by the buckling beam contact concept with a coined contact tip. Zero-insertion force minimizes the IC insertion stress and a latch press mechanism ensures a stable contact force. When the push-cover is pressed down, the IC will be easily guided into the socket. When the push-cover is released, the latch presses onto the surface of the IC which guarantees proper IC seating and necessary contact force appears to the IC pads. The coined tip shape contact ensures a safe and reliable contacting of the IC pads with very low contact resistance.