Application Notes

This document describes the linear feedback shift register (LFSR) fault grading pseudorandom pattern generation (PRPG) and a parallel signature analyser (PSA). An LFSR and PSA are used to test a TI application-specific integrated circuit (ASIC) using SCOPE cells. SCOPE cells are compatible with IEEE1149.1 or boundary-scan. An implementation of the PSA and LSFR using SCOPE boundary-scan cells