Application Notes
TMS570LC-SEP Single Event Latch-Up (SEL) Radiation Report
Texas Instruments
Published : 07 Jun 23
Description
The purpose of this study is to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL)performance of the TMS570LC4357-SEP Arm® Cortex®-R based microcontroller. Heavy-ions with an LETeff of48 MeV-cm2/mg were used to irradiate the devices with a fluence of 1 x 107 ions/cm2. The results demonstratethat TMS570LC4357-SEP is SEL-free up to LETeff of 48 MeV-cm
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