Application Notes
AN-1313 SCAN90CP02 Design for Test Features (Rev. C)
Texas Instruments
Published : 26 Apr 13
Description
The SCAN90CP02 has several design-for-test (DfT) features intended to lower development andmanufacturing test costs:
- IEEE 1149.1
- IEEE 1149.6
- StuckAt fault insertion
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Download application note for AN-1313 SCAN90CP02 Design for Test Features (Rev. C) by Texas Instruments
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