Application Notes
An Accurate Thermal-Evaluation Method for the TLV62065
Texas Instruments
Published : 04 Jun 14
Description
The increase of power density has resulted in the need for accurate measurement of die junctiontemperature. This application report is a basic overview of thermal evaluation and provides an accurateevaluation method of junction temperature in a real application. The evaluation method described in thisapplication is confirmed with bench measurements. This method is proven to be easy to use an
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