GOEPEL electronic extends Boundary Scan Platform SCANFLEX by scalable multifunctional Controllers

“The practical implementation of the recently introduced test and debug standards requires powerful and open scalable system solutions with simple handling. The innovative SFX/COMBO1149 sets a new standards to meet these demands”, says Thomas Wenzel, Managing Director of GOEPEL electronics’ Boundary Scan Division. “The controller’s multifunctionality enables users to program Flash and PLD devices very quickly. Additionally, they can achieve a higher test quality by combining most modern technologies such as processor emulation test, high-speed I/O test, protocol driven interface test and the utilization of chip embedded instruments.”
The SFX/COMBO1149-(x) controller series provides USB2.0 and Gbit LAN interfaces, including three models of different performance classes to be configured by software, enabling TCK frequencies of up to 80 MHz. Four integrated TAPs (Test Access Ports) can be programmed by a multitude of parameters and adjusted flexibly to the unit under test (UUT). Furthermore, the controllers feature dynamic I/O channels, analogue I/O and altogether three extension slots to connect SFX modules. These modules can be utilized to complement the analogue or digital functional hardware range nearly unlimited in all directions.

On this basis, SFX/COMBO1149 is able to support all standardized test and programming techniques such as IEEE 1149.x or IEEE 1532, and many other methods such as processor emulation test, high-speed I/O test, protocol based interface tests and chip embedded instruments. This flexibility opens considerably higher test coverage’s and improved fault diagnostics, savings in separate instruments and additional process steps, and therefore reduces production costs.
The SFX/COMBO1149-(x) controller series is fully supported by the industry leading JTAG/Boundary Scan platform SYSTEM CASCON™ from version 4.5.4 on.