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VPG's Yuval Hernik to Present 'Selecting Resistors to Avoid Unforeseen Stress Factors' Tutorial at CARTS Europe 2010

2nd November 2010

Vishay

ES Admin

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Vishay announced that Yuval Hernik, director of application engineering for Vishay Foil Resistors, will present a tutorial entitled Selecting Resistors to Avoid Unforeseen Stress Factors at CARTS Europe 2010. Taking place on Nov. 10 and 11 at the International Congress Centre in Munich, CARTS Europe 2010 is held in conjunction with electronica 2010.

Resistors from different technologies may seem alike on the surface, and may often have similar published specifications, such as initial TCR and tolerance. However, each offers a unique resistive material and production method. Inherent resistive material, design, and processing variations strongly influence electrical performances, leading to different behaviors after mounting.

In Selecting Resistors to Avoid Unforeseen Stress Factors, Hernik will provide a perceptive explanation of the primary factors that influence resistor stability in a real environment. In addition, he will perform a real-time demonstration that illustrates the differences between bulk metal foil, thin film, thick film, and wirewound resistor technologies, including ESD properties, so that designers can decide which technology best meets their requirements.

The tutorial will take place on Nov. 11 from 11:15 a.m. to 12 p.m. in Room 14A of the International Congress Centre.