Tektronix Showcases New and Enhanced Optical Test Solutions at ECOC 2013

“Tektronix has launched a number of exciting new technology measurement solutions, that help our customers deal with new challenges in High Speed Serial, Optical, Photonic and Communication System Designs,” said Dean Miles, Technical Marketing Manager at Tektronix. “We are looking forward to showing off these new solutions at the show. In addition visitors to the Tektronix booth will be able to participate in a prize draw to win an iPad Mini.”



Highlights on the Tektronix stand this year will include:

• The AWG70000 offers bandwidth on demand by generating wide bandwidth signals at baseband, IF and RF frequencies up to 20GHz, with greater than -80 dBc dynamic range. With up to 16 GSamples of waveform memory, it can generate unique signals that are long enough to simulate real world environments, making it the most flexible wideband signal generation product available today.



• The OM4000 optical modulation analyzer series that offers automated test support for 400G multi-carrier coherent optical modulation. This software option will greatly reduce test times for researchers working on 400G and faster coherent optical systems while providing the flexibility to define carrier count, carrier spacing and modulation formats. It also provides compiled carrier measurement results and multi-carrier visualization for integrated analysis. The new software is available to Tektronix customers as Option MCS on the OM4106D Coherent Lightwave Signal Analyzer and OM1106 Coherent Lightwave Signal Analyzer Software. The OM4106D is tightly integrated with Tektronix DPO70000D Series 33 GHz oscilloscopes and uses coherent detection to acquire fiber signals carrying up to 240 Gb/sec per wavelength.



• A new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels. a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels.



Advanced Optical Solutions

At ECOC, Tektronix will be demonstrating its extensive range of PHY layer test solutions: eye diagrams and jitter performance, stressed receiver testing, crosstalk & BER tests and optical modulation analysis. Tektronix provides expertise and equipment to perform standards-compliant TX, RS and Coherent Optical testing from 125 MB/sec to 100 GB/sec and beyond.