Photon Introduces NanoScan v2, Enhanced User Interface for Scanning Slit Laser Beam Profiler

NanoScan is ideal for profiling CO2 beams used in material processing, said Gary Wagner, General Manager, Ophir Photonics (U.S.). The scanning-slit technology provides the easiest-to-use profiling because it can measure most high power beams without the need for complicated attenuation schemes. Combine that with the new user interface and now users can see their laser beams as never before.

NanoScan v2 supports both the 64-bit and 32-bit versions of Windows 7, enhancing system configuration options and increasing processing speed. The beam profiler combines speed with flexibility. Detector options (silicon, germanium, and pyroelectric technologies) allow measurement at wavelengths from the ultraviolet to the far infrared. It can simultaneously measure multiple beams and offers an optional power meter for scanheads with silicon and germanium detectors

Integrated Automation Interface
For quick integration of laser beam profiling into an automated workstation, the NanoScan-Pro version implements an Automation Server that can be used by an Automation client. The client can be written in Visual Basic for Applications (VBA), C/C++, or by an application with support for ActiveX Automation, such as Microsoft Excel, Microsoft Word, or National Instruments' LabVIEW.

Availability & Pricing
NanoScan v2 is available now. The new user interface is sold as part of an integrated system with beam profiler. U.S. system prices start at $4,695.