Optical modules lift 400G yields

Tektronix also announced enhanced support for the latest 400G PAM4 TDECQ measurements with a software package optimised for 4-channel parallel processing for high throughput manufacturing test.

The modules and capabilities, along with the full set of Tektronix solutions for 100G/400G optical characterisation and validation, are being demonstrated at the OFC optical networking and communication conference and exhibition taking place this week in San Diego, Calif.

“As 400G designs move into production, our customers are looking for ways to improve manufacturing yield and cost of test, which all starts with confidence in test results and the ability to quickly and accurately separate good components from bad ones,” said Sarah Boen, general manager, Performance Oscilloscopes, Tektronix.

When installed in DSA8300 sampling oscilloscopes, the new 80C20 and 80C21 optical modules for 56GBd PAM4 and NRZ offer 9µW optical noise performance. The two-channel 80C21 enables optical manufacturing test engineers to double throughput and capacity.

If a device fails, Tektronix offers a comprehensive set of enhanced PAM4 analysis tools to decompose signal content for noise and jitter to help engineers understand the underlying problem.

To keep pace with demands for more bandwidth in data centres, the optical industry is rapidly making the move to 400G and PAM4.

However, production engineers face challenges to keep per device test cost low due to lower signal to noise ratio, reduced signal amplitude and a more than 10x increase in the number of tests.

The DSA8300-based sampling solutions help lower test costs with the industry’s highest bandwidth, highest sensitivity and with shortened test times. 

The 80C20 and 80C21 optical modules and 400G test software enhancements will be available from April.