Test solutions take the road to Shanghai

9th March 2016

Mick Elliott

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Test solutions for measuring the connected world – and everything in it – will be demonstrated by Advantest at the SEMICON China trade show in Shanghai (March 15-17). In addition to exhibiting, Advantest is sponsoring two events at the show - the Build China IC Manufacturing Ecosystem Forum and the China Semiconductor Technology International Conference (CSTIC).

Advantest will feature the newest test technologies enabling everything from handheld mobile devices to entire smart cities. Equipment on display will include the new AVI64 universal analog pin module that extends the V93000 platform’s test capabilities to encompass all power and analog smart ICs. T

he 64-channel module, which has begun shipping to customers, gives the V93000 single scalable platform the broadest application coverage on today’s market.

When equipped with the new module, the tester can handle all system-on-chip (SoC) devices for such burgeoning markets as mobile computing and automobiles. A live product demonstration will be given in the booth.

Also on parade will be the highly flexible T2000 SoC tester for device characterization along with a 28G OPM (28-gigabit Optical Port Module), designed to enable highly efficient testing of optical transceivers.

Application module on-board (AMO) units, which can be used on both the T2000 and V93000 platforms for testing radio-frequency power amplifiers (RFPA) and radio-frequency switches (RFSW), will also be featured.

The EVA100 Digital Solution will be demonstrated in Shanghai.. This measurement system, available in both production and engineering models, is designed to perform design evaluation, front-end and back-end measurements, fault analysis, package verification and acceptance inspection for all types of cost-sensitive digital devices used in smart electronics of the Internet of Things (IoT) era.