Software, hardware tools on parade at Autotestcon

The JT 2147/eDAK is a multi-function signal conditioning module that allows ‘ideal world’ connections from JTAG Technologies PXI and PXIe DataBlasters to the MAC panel ‘Scout’ connection system.

Based on the QuadPod architecture from JTAG Technologies, the module is an enhancement of JTAGs current DAK interface and has been specifically designed for robust high-integrity ATE systems.

In using the JT 2147/eDAK, test system builders will greatly simplify their wiring task and, at the same time, retain the excellent signal integrity assured by the QuadPod’s active interface.

In addition to four independent JTAG Test Access Ports (TAPs), the JT2147/eDAK features 64 digital I/O scan channels plus 16 ‘static’ DIOs. Each TAP can be programmed to operate through a range of voltage levels and two can also operate as other test and programming interfaces such as BDM or SWD.

Peter van den Eijnden, MD comments ‘JTAG Technologies equipment is used worldwide within high-reliability testers within Mil/Aero and other sectors. The JT 2147/eDAK will greatly simplify the system builder’s tasks and enhance the power of their test systems through improved signal conditioning.’

Also lined up for an appearance is the JT 5705/FXT Multi-Function Tester. This is an example of JTAG’s  ‘fixture embedded’ test technology - the JT 5705/FXT multi-function JTAG tester built into one the small linear series of cassette-based re-configurable fixtures of Everett Charles  Technologies (ECT).

The JT 5705/FXT is a compact, single-board test system that supports analogue measurement and stimulus, frequency measurements, digital I/O, boundary-scan testing and also in-system device programming.

Within the fixture multiple JT 5705/FXT tester cards can be mounted on purpose built carriers featuring the ATE industry standard ‘.