SiP device tester to feature at SEMICON China

7th March 2018

Mick Elliott

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Products and services in demand by the Chinese semiconductor market will be showcased by Advantest at SEMICON China in Shanghai (March 14-16). Among the emerging test solutions on display will be the T2000 AiR system, designed for testing modules and system-in-package (SiP) devices that integrate MCUs and application processors to perform functions such as telecommunications, power management and sensing.

The compact, air-cooled T2000 Air has the flexibility to be used for both low-cost testing in R&D environments and high-mix, low-volume production.

It can be integrated with the M4800 series of handlers to create a zero-footprint test cell, which Advantest calls its Integrated Zero Test Station.

Also featured in the booth will be the EVA100 measurement system, an evolutionary value-added platform designed for both digital and analogue testing of small-pin-count analogue, mixed-signal and sensor ICs used in smart electronics.

Capable of being used anywhere from engineering to volume-production environments, the scalable EVA100 allows simultaneous control of multiple test functions to conduct high-precision measurements and improve testing efficiency.

Other products on display will include the Airlogger WM1000 wireless data-logging system, which maximises the efficiency of testing operations and enables temperature measurements of moving objects.

These capabilities are especially advantageous in the automotive industry as well as other manufacturing and R&D fields.

Advantest also will showcase its CX1000P CloudTesting Service, which offers cost-effective, on-demand test solutions to users working in semiconductor design, electronic component R&D, prototype evaluation, failure analysis and academic research.