SEMICON China to feature AI test solution

11th March 2019

Mick Elliott

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Datasheet

Semiconductor test equipment supplier Advantest will demonstrate and present a technical paper on its V93000 artificial intelligence (AI) test solution for the diverse and fast-growing AI and high-performance computing markets during SEMICON China in Shanghai (March 20-22) The V93000 Single Scalable Platform is already in widespread use at major AI chip designers around the world including China’s leading AI fabless companies.

The V93000 Single Scalable Platform is already in widespread use at major AI chip designers around the world including China’s leading AI fabless companies.

AI and high-performance computing applications include server farms, autonomous cars, edge computing, facial recognition and cryptocurrencies.

The V93000 platform’s scan capabilities, optimal mix of device power supplies (DPS) and high-speed instruments have resulted in the system winning an estimated 80% of the sector’s test market.

When equipped with the Pin Scale 1600B card, one of Advantest’s family of channel cards, the tester is setting the industry standard in vector memory depth for scan and can perform tests at data-transfer rates as fast as 1.6Gbps per pin.

For devices demanding tens to hundreds of Amps core supply, the V93000 can leverage the DC Scale UHC4T card to achieve best-in-class load step response.

To test high-speed ICs operating at up to 16 Gbps, Pin Scale 1600B, Pin Scale 9G and Pin Scale SL cards support pattern-based or pseudo-random binary sequence (PRBS) testing.

In addition, Advantest offers an integrated test cell with active thermal control for devices dissipating hundreds of watts of power during test.

By pairing the V93000 with a M4872 pick-and-place handler, the test cell can achieve maximum throughput while controlling the device-under-test (DUT) temperature within the guard band.

SmartShell software accelerates initial pattern bring-up directly from the design and pattern-generation environment, and a dedicated library is available to support automated test-program generation. Both tools help to reduce time to market for new IC designs.

“AI and 5G are key sectors for our V93000 business and, with recent market wins in China, we are continuing to extend our worldwide leadership in AI testing,” said Juergen Serrer, executive vice president of Advantest’s V93000 Business Unit in the ATE Business Group. “The V93000 Smart Scale system delivers both high performance and a low cost of test, making it the leading test solution for high-end computing, graphics and machine-learning devices.”

During the show’s AI and Semiconductor Technology Forum on March 21 at the Shanghai Evergreen Laurel Hotel, Advantest executive Zhang Ke will give a presentation on AI device testing solutions for both cloud- and edge-computing applications.