Seica at electronica 2024

Visit Booth A3 - 459 to see the speed and the unique performances of the Pilot VX flying probe test platform and the maximum flexibility and configurability of the bed of nails Compact SL.

Automation has become a key factor in optimising today’s manufacturing processes, and visitors to Seica’s booth will see the Pilot VX and the Compact SL presented in a fully automated configuration. Since all of Seica’s solutions integrate the VIVA Integrated Platform (VIP) they can be combined in the same line to optimise throughput by selectively configuring the test process to utilise different technologies and performances to achieve maximum test coverage in the minimum test time

The PILOT VX is equipped with a state-of-the-art mechanical architecture and a motion controllers enable reduction of up to 50% in test time. 12 multi-function test heads provide the capability for double-side probing of up to 44 points simultaneously and a technologically advanced measurement hardware and a new microwave-based measurement technique provides unrivaled test performance.

This platform, with unique options like the FlyPod and FlyStrain and the optimised VIVA software management, is the gold standard in terms of flying probe speed and performance.

VIVA platform saves even more time by enabling the parallelisation of different types of tests, and smart analysis capabilities based on the principles of artificial intelligence can automatically optimise the test flow in run-time.

The FlyPod option extends testing capability even more by specialising a single mobile probe to carry up to 14 channels, enabling access to boundary scan circuits and adding onboard programming capability without any external fixed cables while the FlyStrain option can also generate pressure/force topology maps of the device under test.

The Pilot VX is a tremendously powerful asset, deployable in every phase of today’s accelerated product lifecycle, from concept, to design, to prototype, to production. The intrinsic capability of the Pilot VX flying prober to give immediate, extremely precise access to all of the points on a first prototype board, coupled with an extensive suite of measurement hardware and software tools, including the PR boost feature with the capability to power the board (up to 2A per probe) with all of the 8 standard electrical probes enables the test and validation of prototypes quickly and with minimum effort.

The Compact SL is designed to maximise configurability and customisation, satisfying the full range of test requirements: from in-circuit, to functional, to combinational, as well as performing other tasks such as onboard programming (OBP), with the speed and flexibility to meet todays’ demanding throughput targets.

The test solution on display includes the new ATE BOOSTER module, the latest addition to the vast suite of performances available, designed to maximise LED test capability and OBP performances, while reducing costs by means of innovative optimisation of the hardware resources required.

The MINI 80 test solution, part of Seica’s VIVA Integrated Platform (VIP) will also be on display. A very useful and cost-effective platform to develop your customised ICT and functional test benchmarks, it provides a wide range of integrated instruments, switching matrices and user power supplies. The user has broad discretion in the choice of configuration and programming languages: the VIP platform allows easy integration of off-the-shelf instrumentation, and test sequences can be developed using the VIVA Test Studio environment as well as a wide range of third-party software including LabView, TestStand, C, and Python.

Canavisia, a Seica Company, will also be present at Electronica Booth A3-459 with a series of Smart Tools for electronics designers, test and production engineers which can be deployed as stand-alone solutions or embedded in integrated manufacturing systems, whether for small or high-volume production.

DeviceClip is a universal ISP (In-System Programming) programming tool designed for programming all types of semiconductor devices (microcontrollers, serial memories, programmable logic devices) from any semiconductor manufacturer. The solution is modular and can be configured to provide up to 64 parallel, totally independent, multi-protocol ISP channels, and is provided with an embedded control panel compatible with any operating system. Its integrated high-performance microcomputer enables DeviceClip to reach the maximum programming speed of any device, and each channel within the module can be configured to support totally different targets ensuring an extremely high level of flexibility.

Visitors will also see the new LedMeter tool for testing the LEDs which are commonly assembled on electronic boards. This Smart Tool measures RGB, Hue, XY chromaticity, color saturation and relative intensity and wave length in nano meters. LedMeter has a modular architecture for easy scalability, based on i2C communication: each control module can manage up to 64 sensors and is available in a TTL <> USB and RS232 version.

All of the solutions on display include Seica’s VIVA NEXT software platform, which is able to provide intelligent integration with all aspects of the customer’s manufacturing processes - data collection, traceability, interaction with MES, repair operations – and all of the Next> series systems have Canavisia’s Industrial Monitoring solution on board, for remote monitoring of current and voltage consumption, mains supply, temperature, light indicators and other parameters useful to indicate correct operation, provide information for predictive maintenance and, in general, to render the systems compatible with today’s Industry 5.0 standards.