RF test solution headed to SEMICON Europa

These include the Wave Scale MX and Wave Scale RF cards, which enable the V93000 to achieve unprecedented levels of parallelism and throughput in testing radio frequency (RF) and mixed-signal ICs for wireless communications while also reducing both the cost of test and time to market.

Another enhancement on display will be the DC Scale AVI64 universal analogue pin module, which gives the V93000 platform the industry’s broadest capabilities for testing power and analogue ICs used in mobile applications.

Also highlighted at the stand will be the T2000 IPS tester for integrated power devices and performance boards that support a host of test requirements for state-of-the-art ICs such as analogue, high-speed and high-density devices.

Advantest’s exhibit will feature live demonstrations of the EVA100 tester for digital and analogue testing of small-pin-count semiconductors and the company’s innovative CloudTesting Service, providing access to the latest high-quality test methods utilizing advanced IP, characterisation tools, analysis systems and more for design and DFT engineers.

For attendees interested in advanced metrology and nano-patterning applications, the stand will include exhibits on Advantest’s line of E3310, E3640and E5610 SEMs for inspecting next-generation wafers, photomasks and blanks as well as the F7000 system enabling E-beam lithography at advanced technology nodes.