First World Congress registration is now open
The British Institute of Non-Destructive Testing (BINDT) has announced that registration for the First World Congress on Condition Monitoring (WCCM 2017), being organised in co-operation and partnership with the International Society for Condition Monitoring (ISCM), is now open.
The combination of the efforts of two leading organisations creates the largest event of its kind at a truly international level and is of major significance, being the first world event in its field.
The congress will take place from 13th to Friday 16th June 2017 at the ILEC Conference Centre, London, UK. The event will embrace all aspects of condition monitoring and related areas and will provide attendees with an opportunity to network with academics and industrialists from all over the world.
Programme
There will be six sessions running in parallel covering a wide range of advances in CM fields, which will include:
- Plenary keynote presentations
- Invited overview presentations
- Invited and contributed presentations, including case study presentations
- Industrial sessions for major industrial sectors
- Workshops on advanced topics in CM, led by recognised scientists and engineers
- Expert panel session on hot topics in CM
- Exhibition, vendor presentations and plenary spotlight sessions for exhibitors and sponsors.
BINDT has always recognised the importance of encouraging students to participate in major international events. As a gesture to celebrate the First World Congress on Condition Monitoring, the Institute will be providing generous sponsorship of student registrations in 2017, resulting in a major reduction in fees for student attendance.
Exhibition
An exhibition comprising around 20 sector specialist companies will take place on the second and third days of the congress and will provide an ideal opportunity to gain an insight into the up-to-date technologies currently available.
To attend the congress and gain the early registration discount, which is available until 28th April 2017, please click here for the registration page.
Further information about presenting at or attending this prestigious event can be found here.