Digital measurement challenges solved in Santa Clara

In addition, Keysight will deliver eight complimentary, 40-minute education workshop sessions led by Keysight industry experts. Topics include USB Type-C, signal and power integrity, 400G/PAM-4, PCIe4, DDR4/LPDDR4, data analytics and IBIS-AMI simulation basics. Keysight will make copies of the presentations and videos available following the show to everyone who registers at the Keysight booth.

Keysight will demonstrate its latest USB Type-C transmitter and receiver test solutions, developed to properly characterise and validate USB designs, as well as its cable and connector test solution using its network analyser with the TDR option.

It will also demonstrate the tools and techniques that engineers can use to test PCI Express 4.0 devices, specifically the physical layer Gen4 requirements for transmitters and receivers.

For Signal Integrity and Power Integrity Keysight will show a cohesive solution for signal and power integrity analysis. This includes new design and test techniques to gain rapid insight, as well as new channel simulation techniques.

Keysight’s Physical Layer Test System is a new software release and features PAM-4 eye diagrams, channel operating margin (COM) and a SCPI command interface for manufacturing automation applications.

Also on show will be the Digital Interconnect Test System Reference Solution, used to enable signal integrity characterisation of multiport interconnect products.

For 400G/PAM-4, Keysight will show new measurement techniques, including its new M8040A highly integrated 64Gbaud high-performance BERT, developed for testing electrical and optical PAM-4 transmitters and receivers.

Keysight will demonstrate how to easily acquire cross-correlated measurements of traffic on DDR/LPDDR buses and the power integrity of systems, as well as innovative new probing and debug techniques that provide rapid insights for engineers into their high-speed memory systems.