Debut makers lined up for SEMICON Japan

14th December 2015

Mick Elliott

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Advantest will have a prominent presence at the SEMICON Japan trade show (December 16-18) at the Tokyo Big Sight international exhibition centre. In addition to showcasing a wide spectrum of automatic test equipment (ATE) and presenting a technical paper, Advantest is a gold sponsor of this year’s event, which includes sponsoring the President’s Reception on December 16.

The company will also three days of executive presentations in the SuperTHEATER, including the show-opening keynote address, the first day’s semiconductor executive forum and the forward-looking Life & Smart Car forum.

Advantest’s booth will feature the Japanese market debuts of several new products. These include the EVA100 Production Model and a digital solution for volume-production, theT5833 memory tester for NAND, NVMs and DRAM, the T5851 system level tester for Universal Flash Storage (UFS) and PCIe BGA Solid State Drives (BGA-SSD), the TS9000 TDR (Time Domain Reflectometry) for IC fault isolation and analysis,a highly parallel performance board and a power multiplexer (mux) module for the V93000 test platform, a massive parallel board solution for testing analog and automotive devices on the T2000 platform and a novel DUT fixture for the T2000 28G OPM module.

Other productivity enhancements for established Advantest systems also will be on display in the booth including a design-evaluation board for the V93000 platform, a probe card for the T6391 LCD driver test system and the CX50 station for Advantest’s unique, on-demand CloudTesting Service.

Bringing insights into the latest IC test technology, Shin Kimura, vice president of Advantest’s ASD Test and Measurement Business Group, will present a paper on “Mass Production Measurement Technology Required for Sensors” at TechSTAGE North on December 16.