Comprehensive test solutions on parade at ITC 2018

This latest hardware and software tool measures DUT power for the entire test cycle and graphically conveys the results back to the device test sequence to optimise device power and test time. 

The CloudTesting Service allows users to access various test method IP selections on Advantest’s web site whenever needed.

Using this on-demand online service, designers can verify their new silicon at a very low cost with no capital investment, set up their own test environments within a few hours and be ready to test when the device arrives from the fab.

At ITC, visitors to the booth can see the desktop test station with a live demonstration of how fast a device can be verified with STIL-generated design-for-test (DFT) patterns.

With free tester leasing and minimum maintenance costs, Advantest’s CloudTesting Service allows customers to avoid unplanned expenses.

Advantest’s EVA100 analogue/mixed-signal test solution combines a modular architecture with high-voltage and high-precision analog parametric measurement units, providing the flexibility to conduct various measurements over a broad range of analogue and mixed-signal devices.

The scalable architecture can be quickly reconfigured to address a varied product portfolio and achieve lower cost benefits from economies of scale.

In addition to product exhibits, Advantest experts will discuss the latest test technologies over the course of ITC’s three-day technical program.