Cloud testing showcased at RADECS 2017

The conference, which takes place at the Centre International des Conferences de Geneve (CICG) Geneva, Switzerland, from 2-6 October, features a technical programme, an exhibition and one day tutorial or ‘short course’ on radiation.

Advantest will demonstrate its CTS test solution, which offers the latest high-quality test methods utilising on-demand IPs, characterisation tools, analysis and more.

These advancements provide design and DFT engineers with an alternative for silicon validation while reducing debugging time and cost, enabling them to verify their new silicon with no capital investment, set up their own test environment within a few hours and be ready to test when the device arrives from the fab.

Visitors can see live demonstrations of how easy the desktop test station can capture various data required for radiation-effect analysis on semiconductor devices.

With free tester leasing and minimum maintenance costs, Advantest’s CTS allows customers to avoid unplanned expenses.