Advanced IC test solutions set for SEMICON Korea

24th January 2018

Mick Elliott

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Leading semiconductor test equipment supplier Advantest will present its innovative test solutions at SEMICON Korea in Seoul (January 31-February 2). Additionally, Advantest is a platinum sponsor of SEMICON Korea and the Industry Leadership Dinner, which will take place the evening of January 31.

Advantest will exhibit its advanced IC test solutions including the V93000 Wave Scale platform for next generation RF ICs, the V93000 HSM16G system for ultra-fast memory IC test and the T6391 tester for display driver ICs (DDI).

Various configurations of the T2000 platform will be featured in this year’s booth, including the T2000 AiR, a compact test cell for high-mix, low-volume system-level testing of IoT devices, the T2000 IPS for PMICs and 24-bit audio codec, and the T2000 ISS for high-speed CMOS image sensors as well as the T2000 RECT680 0.35-mm fine-pitch performance board.

Other test solutions on display will include the HA7200 temperature and pressure unit paired with the EVA100 measurement system for production-volume testing of analog, digital and mixed-signal devices; the cost-effective T5851 system for high-performance universal flash storage devices and solid-state drives (SSD) and the flexible MPT300 series of testers for SSDs. The T5503 series for next-generation memory ICs used in mobile applications and servers also will be showcased.

There will be additional exhibits highlighting probe cards, high-speed memory device interfaces and e-beam metrology and lithography solutions including the F7000 e-beam lithography tool, capable of meeting resolution requirements for 1X-nm technology nodes, and the E3310, E3640 and E5610 SEM-metrology systems.

Live demonstrations, digital graphics and in-depth product presentations will provide guests with technical insights into Advantest’s newest IC test innovations and its proven solutions for the Korean market.

On Wednesday, January 31, at 1:40 p.m., Ok Su Kim of Advantest will present a technical paper on “5-Gen, RF Testing Solutions” during the Test Forum program.