Events News

5G capabilities to the fore in Barcelona

20th January 2016
Mick Elliott
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At Mobile World Congress (MWC) 2016 in Barcelona (Feb 22-25), Anritsu will be showing its extensive capabilities in supporting the industry development of 5G networks, with a range of technologies and research activities across the whole spectrum of network architecture, air interface, network access and service assurance.

A key discussion point in the mobile industry, and especially in the test and measurement segment, will be the use of new technologies to enable the next generation 5G networks whether it’s at new millimetre wave bands or an evolution of existing standards.

Although much of the headline discussion is on the implementation of a new air interface, the 5G network will have an impact across the whole “end to end” network and service domains.

Anritsu will be explaining its test and measurement solutions for developing the new 5G air interface with practical examples including LTE-A Pro scaled-up to 1GB/s, experimental new waveforms, mmW measurement, OTA and massive MIMO test needs.

They will also be showing the development of new test methods for emerging 5G device technology, using the latest technology of “modulated S Parameters”.

Within the access network, increased capacity is driving towards C-RAN, and HetNet deployment with CPRI and DAS, and the move to DWDM optical networks.

Anritsu will be showing unique field test solutions for the full range of C-RAN deployment. This will include RF and CPRI testers, optical transport network testing to support this new technology deployment, and also SDN and NFV transport network implementation, configuration and maintenance.

As LTE-A progresses to Release 13 and beyond, into LTE-A Pro, so the test requirements for both ultra-high speed broadband and enhanced Machine Type Communications (eMTC) continue to evolve.

Anritsu will be demonstrating the latest UE technology running on their leading device test platform solution, as well as some of the unique applications and connectivity testing methods.

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