EEA shortlist: Neumonda

At embedded world 2025, Neumonda will demonstrate the latest update of its Rhinoe DRAM Testboard that was launched at embedded world 2024. With this tester, Neumonda aims to transform one of the most complex and expensive steps in the manufacturing of memory ICs.

Today, semiconductor testing requires large-scale equipment that needs a lot of physical space and – often secret IP – to run performance and temperature tests in a sterile environment. Due to the costs of the equipment, tests are kept as short as possible and cover the requirements of standard applications.

Furthermore, secret circuitry is added to the memory chips to make them effectively testable such that fabless companies and third parties are practically excluded from testing them and support specialty applications.

However, there are errors in DRAM technology that only arise in longer run times, like for example, variable retention time induced fails or signal integrity issues. For older DRAMs like DDR4 used in industrial and embedded applications, this means that the test patterns are either not available anymore because the manufacturer has moved on to newer technology generations, or the customer is too small to prioritise the retesting of failing DRAMs.

Neumonda Technology fills this gap with its Rhinoe tester. The tester conducts vendor-independent tests that also simulate the actual environment in which the DRAM memory is deployed in to predict potential failures much more accurately. This can eliminate the risk of costly recalls of failing memories once they are widely deployed. All this can be done at a fraction of the investment costs of traditional testers. This is unique in the market.

For more information, visit: https://www.neumonda.com/neumonda-technology/

The Electronics Excellence Awards ceremony will take place at embedded world on 12th March at 4.30pm at the Hall 3 Forum.

You’re all welcome to come and see which product will win!