Successful tests of CISSOID components by NASA

2nd February 2009

Cissoid

ES Admin

0 0

CISSOID has released recent test results of their circuits by NASA for extreme high and extreme low temperature applications. Researchers at NASA’s Glenn Research Center have tested recently a CHT-555 SOI timer circuit. The circuit was provided unpackaged by CISSOID and then tested using special high temperature packaging technology developed at Glenn.

The CHT-555 timer has operated at +375°C for 750h before the temperature was intentionally decreased. Even if the performances of the circuits at such temperature were lower than the standard specification range, these results indicate that with high temperature packaging technology CHT-555 timer circuits may operate at temperatures even above the current temperature specifications. These results have been presented at the SAE power system conference in Seattle.

Previously, engineers at Glenn Research Center had tested several CISSOID components for cryogenic temperature applications. The CHT-555 (555 timer), CHT-BG (Voltage reference), CHT-OPA (Operational Amplifier) and CHT-LDO-033 (+3.3V Voltage regulator) have been tested from -195°C to 100°C with extremely good and stable results. Combining the results from NASA and CISSOID’s own results at temperatures as high as 300°C, these circuits have shown a world record of SOI circuits in terms of temperature range. For example, only 6% variation was measured for the Voltage reference from -195°C to +300°C.

These test results open new perspectives for applications that require reliable operation in extremely wide temperature ranges.