Analysis
Recognition for Keithley Instruments by TI
Keithley Instruments has announced that it has received the Texas Instruments 2006 Supplier Excellence Award. The annual award honours firms whose dedication and commitment in supplying products and services meet TI's high standards for excellence. Recipients are chosen for their exemplary performance in the areas of cost, environmental responsibility, technology, responsiveness, assurance of supply, and quality. TI’s management team from the WPL-Assembly and Test Capital Equipment business group presented the award to Keithley personnel.
KeitThe Model 4200-SCS incorporates tightly integrated DC and pulse measurement capabilities with application packages for turnkey semiconductor test solutions. Keithley recently announced a variety of enhancements to this system, including three new application packages, an enhanced pulse generator card, and a new scope card, that offer powerful new solutions for such areas such as Flash memory testing, high-power radio frequency (RF) device testing, and pulse testing for advanced semiconductor materials.
Keithley Series S600 parametric testers are designed to help fabs and wafer foundries reduce their cost of test. Key advantages of Series S600 testers include on-wafer DC to RF testing on a single platform, a wide range of applications, and SECS/GEM automation for 200 and 300 mm.
“This award is particularly meaningful given the strict standards and rigorous quality metrics required by TI,” said Keithley vice president, business management Mark Hoersten. “We are grateful to have customers recognize our own commitment to providing the highest levels of measurement integrity, outstanding customer service, and dedication to reducing Cost of Test.”
Hoersten added that the TI Supplier Excellence Award is one of several honors Keithley has won recently from customers and industry analyst groups that recognize the firm’s gains in measurement performance and ability to deliver consistent customer service on a global scale.