Analysis
NeoPhotonics® Photonic Integrated Circuit (PIC) Products Surpass 3 Billion Operating Hours Without A Reported Field Failure
NeoPhotonics Corporation today announced its PIC products had accumulated more than 3 billion hours of operation without a reported field failure.
SincFor NeoPhotonics, reliability has been one of the most important characteristics of our products and our design for reliability starts with the beginning of product development, said Tim Jenks, CEO and Chairman of NeoPhotonics. With the accelerating deployment of 100Gbps data transmission, a single 40 channel AWG deployed several years ago may soon be carrying a few trillion bits of information every second. At those data transmission volumes, a single point of failure in a network could disrupt tens of millions of individual phone calls and other data flows, and our customers look to NeoPhotonics to provide the reliability necessary to minimize the risks of these types of field failures, continued Mr. Jenks.
NeoPhotonics designs is products for reliability by subjecting design elements to Highly Accelerated Stress Testing, or HAST, carrying out Telcordia qualification testing its products, and conducting Ongoing Reliability Testing, or ORT, on production samples during the product's life cycle, said Dr. Wupen Yuen, Vice President of Research and Development of NeoPhotonics. Because our PIC products integrate many functions into a single optical chip, thereby eliminating many interconnection and packaging elements, we believe we are able to achieve much higher product reliability than is possible with comparable products made of non-PIC discrete components, concluded Dr. Yuen.