Analysis
National Instruments to Host Free Technical Conferences in 27 North American Cities
National Instruments today announced open registration for the 2009 NI Technical Symposium, a series of free, full-day technical conferences that highlight the cutting-edge technology that can help engineers and scientists increase productivity and improve efficiency. Offered in 27 cities in the United States and Canada from October through December, the conferences will deliver technical sessions, hands-on tutorials and new product demonstrations to more than 3,200 engineers and scientists. Attendees also can visit with NI R&D engineers and local sales representatives, National Instruments Alliance Partners and third-party vendors to learn more about the technologies driving advancements in embedded design, control and test.
“TEach NI Technical Symposium offers up to 18 technical sessions on topics such as virtualization; wireless sensor networks; power measurements; text-based math scripts to real-time hardware deployment; data management; real-time testing; and noise, vibration and harshness (NVH) and machine condition monitoring. The conferences also feature a keynote delivered by National Instruments leadership that highlights how graphical system design and technologies such as NI LabVIEW software, powerful data acquisition and high-performance modular instrumentation can help engineers and scientists quickly innovate on solutions to the world’s most pressing problems.
Additionally, NI Technical Symposium attendees can learn about and see demonstrations of new products including LabVIEW 2009, the latest version of the graphical system design platform that simplifies complex programming tasks such as parallel programming, virtualization, wireless communications and real-time math. Other new products to be featured include NI X Series multifunction data acquisition devices, the NI wireless sensor network platform, NI VeriStand real-time testing software and NI Real-Time Hypervisor software.