Analysis

Multitest to Exhibit New Test Solutions at Silicon Valley Test Conference 2011

25th October 2011
ES Admin
0
Multitest,will exhibit its test solutions at the upcoming Silicon Valley Test Conference, scheduled to take place November 10-11, 2011 at the Biltmore Hotel in Santa Clara, Calif. At the conference, Multitest will showcase the most comprehensive portfolio of contactors on the market.
The test socket portfolio covers the widest scope of applications for the full temperature range from -60° to 200°C:

• Bandwidth up to 40 GHz
• High power/high current up to 1,000 A
• KELVIN Contactors

The portfolio is based on Multitest’s advanced Cantilever Technology and the proprietary Quad Tech™ concept, and includes contacting solutions for:

• All handler types and brands
• Leaded and lead-free package
• Array and inline package
• Small-pitch devices down to 0.25 mm
• Singulated test, strip test and WLCSP

Multitest also will highlight its ATE printed circuit board design, fabrication and assembly resources. State-of-the-art production equipment and Multitest’s long-term experience ensure reliable on-time delivery and industry-leading quality for advanced applications such as 0.4 mm pitch. The company’s well-established production process avoids sequential lamination, even for high-layer count boards.

Additionally, Multitest’s experts will present the following topics at the conference:
• Signal and power integrity in the test interface
• Kelvin contacting – applications and solutions

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