Free Keithley Web-Based Seminar Reveals Secrets for Getting Good C-V Measurement Results

Those participating in Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will have the opportunity to learn:

* How to properly connect a C-V instrument to a probe station
* Common cable correction techniques
* Performance verification at the probe tips
* How to identify and troubleshoot typical C-V errors
* How to implement extended C-V applications, such as high voltage and quasistatic C-V

This seminar is intended for those whose job requires performing C-V measurements. Students, technicians, engineers, and lab managers who are responsible for installing and maintaining C-V equipment and probe stations will also benefit from this seminar.

About the Presenter.
Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information.

Tips, Tricks, and Traps for Semiconductor Capacitance-Voltage (C-V) Testing will be broadcast on Thursday, March 25, 2010 at 15:00 CET (2 p.m. GMT) for the European audience. The event is free to the public, but participants must register in advance at http://www.keithley.info/cvtesting10. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.