Analysis

First Weblog for Nanotechnology Electrical Testing is sponsored by Keithley

3rd June 2006
ES Admin
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Keithley Instruments has co-developed and sponsored the first Nanotechnology Test Weblog, or Blog, designed exclusively for engineers and researchers dealing with electrical testing issues in the field of nanotechnology and MEMS (micro electromechanical systems). The Nanotest Weblog keeps visitors abreast of the latest news in the nanotechnology and MEMS industry through frequent posts of technical and business developments. The Weblog is coordinated by Nanotech Briefs magazine and can be accessed directly at www.nanotestblog.com.
Linda Bell, Publisher of Nanotech Briefs, said she expects the new blog to be an important contribution to the emerging field of nanotechnology. Engineers working in the rapidly changing disciplines of nanotechnology and MEMS need to stay abreast of the latest developments in their respective
fields, and the Nanotest Blog is the ideal way for engineers to do that, said Bell. With the support of Keithley, this Blog creates a center for those seeking to study and improve upon the latest test techniques in developing nano-materials, says Bell. The ability to create accurate and repeatable measurements at the nano-scale level is critical to engineers seeking to develop these next generation materials.

The Blog is a means to communicate advances in nanotechnology measurement technique and capability, according to John Tucker, Keithley's Lead Industry Consultant and Marketer for Nanotechnology. Engineers and researchers who are developing the next generation of materials and
electronics, including those for the semiconductor industry, need to be kept informed of the latest breakthroughs and electrical testing technologies. The Blog offers a forum to share feedback on the many issues of making measurements on the nanoscale.

Visitors to the Nanotest Weblog can post responses to particular items or post questions to other Weblog visitors. There is also a link to a library of white papers and articles as well as announcements of upcoming conferences and events of interest to the nanotechnology and MEMS test and
measurement community.

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