VOICE 2013 User’s Conference for SoC & Memory Semiconductor Devices & Handler Test Technologies

The seventh annual VOICE conference on April 23-25, 2013, at the DoubleTree Hotel in San Jose, Calif., will open with two days of technical presentations, one-on-one meetings and a suppliers’ expo, followed by a third day of hands-on workshops – all focusing on future-ready, scalable SOC and memory test solutions from Advantest.

“Following an exciting inaugural year with presentations covering the full Advantest SOC and memory portfolio, we expect VOICE 2013 to have an increased number of new users with a wider range of customer offered solutions,” said Don Blair, Principal Consultant at Advantest and chairperson of the VOICE conference’s steering committee. “The expanded portfolio from Advantest, including handlers, will multiply the attendee learning opportunities at VOICE.”

“VOICE is an important facet of our ongoing commitment to high quality customer care,” said Keith Lee, president and CEO of Advantest America, Inc. “We place great importance on creating true value for our attendees by continually improving, expanding and differentiating our conference from others in the industry. For example, for VOICE 2013 we will provide a collaborative forum for exchanging information and perspectives on the latest semiconductor testing techniques as well as best practices for our SOC and memory test platforms.”

Each year, VOICE attracts hundreds of attendees from leading integrated device manufacturers, foundries, fabless semiconductor companies and outsource assembly and test houses. The 2013 conference is expected to draw an even larger and broader audience of test professionals as the event continues to expand.

The 2013 technical program will be focused around five tracks covering:
-Device Specific: Demonstrate the latest techniques for testing MPU, MCU, communications, automotive devices, CMOS imaging, sensors, PMIC and more.
-Test Engineering Efficiency: Offer tips on writing fast test programs, fast.
-Test Techniques and Methodologies: Illustrate new techniques and discuss new solutions.
-Production Test: Discuss cost effective and throughput-optimized solutions for the whole test cell including tester and handler.
-Memory: Explores the most efficient and cost effective memory testing for Flash and DRAM memory users.