/> CT X-ray technology with micron and sub-micron voxel resolutions has become a powerful inspection tool for a variety of inspections in research and industrial practice. In virtually all non-destructive testing application fields, dimensional measurement or microstructure analysis using CT leads to increased awareness and significant productivity improvements.

All interested parties are invited to submit abstracts to present at the conference, pending the April 30, 2010 deadline. The symposium is an opportunity to gain insight into the unique and versatile applications of high-resolution CT and to benefit from the knowledge of experienced users.