Vector Network Analyser for single sweep measurements

The live demos, in Switzerland, France and Sweden, will showcase Anritsu’s VectorStar ME7838G broadband VNA, capable of making measurements from 70 kHz to 220 GHz in a single sweep. The ME7838G, together with MPI’s 200mm probe station, allows on-wafer measurements that span into the upper mmWave frequencies for more accurate device characterization.

The first stop on the tour is in July and August at ETH Zurich at the Institute of Electromagnetic Fields (IEF) in Switzerland, which researches the wave and particle characteristics of electromagnetic fields at all frequencies. 

From September 21st, engineers can see the demo at the Université Grenoble Alpes in France at its department of  Centre Interuniversitaire de MicroElectronique et Nanotechnologies (CIME), while in November, the demo will be hosted by Chalmers University of Technology in Sweden at its department of Microtechnology and Nanoscience.

The VectorStar-based broadband system gives engineers confidence in the systems they are designing by characterising the devices from near-DC to well beyond the operating frequency, allowing more accurate modelling.

Features and benefits of the Anritsu VectorStar ME7838G include:

• Broad frequency coverage to 220 GHz, with extensions to 1.1THz.
• Eliminates the time-consuming, error-prone concatenation process across the RF, microwave, and mmWave bands.
• Modular architecture allows system to grow as needed.
• Reduces the risk of waveguide band extrapolation error in device modelling.

With the VectorStar ME7838x series, RF and microwave engineers now have a powerful measurement tool for analysing the performance of devices ranging from transistors in an on-wafer environment, to communication systems in commercial or defence applications.