The ICON contactor is designed specifically for maintaining the native impedance of the device–under–test (DUT) through the contactor to the test system. Functional and AC parametric testing of high speed devices requires a high and bandwidth low noise interconnect to maintain the quality and/or fidelity of the test signal.

The Diamondx test platform from Xcerra can scale up to over 5000 display driver digitisers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialised instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.

The pick-and-place handler, MT9510 XP, from Xcerra, successfully passed the onsite buy-off for an automotive LED test application at a leading lighting manufacturer. The MT9510 XP solution enables the customer to test high volumes of LED devices with best temperature performance. 

The Xcerra HSI1x instrument from Xcerra for the well-established Diamondx platform features 32 transmit lanes and 24 receive lanes with up to 12.8Gbps data rate. The instrument can be used for protocol and physical layer testing of leading edge SerDes ports, such as MIPI, PCIexpress, VbyOne, HDMI and USB, found on the latest applications processors, flat panel display devices, and other high performance ICs.

A major player in global semiconductor manufacturing has installed XCerra’s MT2168 XT Semiconductor Test Handler. The handler meets the growing demand in high volume production for reliable and cost-efficient tri-temp test handling of multi-chip packages and modules in the automotive and consumer markets.

The range of Flying Probe test systems at atg Luther & Maelzer has been extended with a line for test areas of up to 40in. width. The oversized systems complement the standard line which can load boards with sizes of up to 27in. width. Special network technology and aerospace applications are driving the demand for high test coverage and 4-wire testing (Kelvin test) for large PCBs.

SITRI, the Shanghai Industrial µTechnology Research Institute, has added barometric pressure sensor test and calibration to its test services offering from Xcerra. The extension to SITRI’s MEMS test capabilities is based on an Xcerra Test Cell solution that includes an LTX-Credence Diamond tester, a Multitest InStrip handler and the Multitest InGyro, with the InBaro test module.