Shanghai Hua Hong NEC Electronics Company, Ltd. and Advantest Corporation have collaborated to successfully develop a wafer-level, multi-site parallel test solution for radio-frequency identification semiconductor devices that meet industry-standard ISO 14443 guidelines.

Advantest Corporation today announced that a new product line of fully automated and integrated test and handling solutions for TSV based 2.5D and 3D products is under development. The concept model test cell dubbed, DIMENSION, integrates a high parallel test cluster along with singulated die and 3D die stack automated handling capabilities.

Advantest Corporation today announced its new memory test system, the T5811, targeting DRAM memory core test. Available from July 2012, the T5811 reduces power consumption by 90% and floor-space requirements by two-thirds, compared to previous models, and is upgradable via a simple exchange of components.

Advantest Corporation today announced that it will launch a new test solution, dubbed CloudTesting Service (CTS), which utilizes cloud computing technology to offer cutting-edge test technology for semiconductor device R&D and design applications.

Just ten months after launching its Smart Scale generation of testers, Advantest Corporation has shipped its 100th V93000 Smart Scale system, capable of scalable, highly cost-efficient testing of IC designs for the 28 nm technology node and beyond.

Advantest Corporation today announced that its quadrennial corporate exhibition, Advantest Expo 2012, will be held at the Tokyo International Forum on June 6th—7th, 2012. The event will showcase Advantest’s present and future with numerous tools and equipment displays, as well as keynote speeches and seminars exploring the diverse sectors where Advantest has a presence. Attendance is expected to include the general public as well as industry ...

Advantest Corporation announced the availability of its next-generation high-speed DRAM test system, the T5511. The new system, which begins shipping this month, offers the industry’s fastest test speed of 8Gbps.