Rad-hard devices meet global standards
ST’s new series of rad-hard devices combine proven 130nm process technology with dedicated chip architecture and layout rules to achieve superior radiation-immunity and electrical characteristics. The development has been supported by the French Centre National d'Etudes Spatiales (CNES) and the European Space Agency (ESA) for use in future commercial and government satellite projects.
The series of LVDS drivers, receivers, and multiplexers carry the US 300krad QML-V qualification, and are also QML-V qualified, enabling approval for use by space agencies and contractors worldwide.
“These high-performance devices are a new result of the long and fruitful collaboration of ST, ESA, and CNES in the development of rad-hard products for space, and we are eager to see them added to the European Preferred Part List,” commented Jean-Louis Venturin, Head of Section, Environment and Components at CNES.
Jean-Francois Vadrot, STMicroelectronics Manager of the Aerospace & Hi-Rel Business Unit, added,“ Our new LVDS devices have a complete set of radiation test reports and macromodels, including end-of-life and end-of-radiation, delivering a best-in-class solution that further strengthens our offering for the worldwide Aerospace market.”
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