Seica at Semicon West USA

Seica USA is an exclusive distributor for Osai Automation Systems, as well as Focused Test Inc. semiconductor test solutions. Seica has partnered up with these co-exhibitors in one large booth, with an assortment of Semiconductor handling and Power, GaN and SiC test solutions. And, as the world leader in Flying Probe test technology, Seica is where customers look for leading-edge wafer, probe card, and electronic board testing solutions.

In the spotlight – Seica’s Flying Probe Tester, Pilot VX Next >Series

The Flying Probe Tester Pilot VX Next> series represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume testing, maximum test coverage and flexibility, for prototyping, manufacturing, or repairing any type of probe card, wafer, substrate or CCA. Its vertical architecture is the optimum solution for probing both sides of the device simultaneously. Seica’s Pilot VX Next series on display will be shown testing a ceramic wafer and the same configuration is used to test the most complicated probe/MLO boards produced in the world today.

The Flying Probe Tester Pilot VX Next> series is suitable for:

• Wafer test
• Probe Card/MLO test
• Product validation testing
• Vectorless and in-circuit tests
• Programming and functional tests
• Boundary Scan test
• Medium/high volumes with automatic loader
• Highly-integrated prototypes
• High-mixed products
• Boards not designed for testing
• Reverse Engineering and Repair

In the spotlight – Focused Test, Inc. FTI 1000 and FTI2000

Focused Test Inc. announces the launch of our FTI 2000 Power IC test system which will be on display at the booth by our US distributor, Seica Inc.

FTI 2000 offers a high throughput, low cost and scalable test solution for power IC’s such as Regulators, Voltage Converters and Gate Drivers thanks to its Tester per Channel Board system architecture. FTI 2000 provides high voltage (1,000V), high current (100A) and 100 MHz digital performance needed for multisite production, engineering characterisation and failure analysis test of the latest power ICs. Its small footprint makes efficient use of valuable test floor space.

Focused Test continues to extend the range of the FTI 1000 power discrete test system to address the needs of the SiC Mosfet and GaN HEMT Wide Band Gap power markets, including higher voltage and higher current DC and UIS, Delta Vsd, and Short Circuit tests.